The Analytical Chemistry Springboard
- An Introduction to Surface Chemistry
A web tutorial written by Dr. Roger Nix, Department of Chemistry, Queen Mary & Westfield College, University of London. Topics dealt with in separate sections are: Structure of Metallic Surfaces, Adsorption of Molecules on Surfaces, The Langmuir Isotherm, UHV & Effects of Gas Pressure, Surface Spectroscopy, Overlayer Structures & Surface Diffraction, and Surface Imaging & Depth Profiling.
- Image Calculation Techniques
HREM images calculation can be used to: Understand the contrast of experimental micrographs, test whether resolution of a particular microscope will be high enough to solve a problem (i.e. to distinguish between two or more proposed models for a defect structure), and to calculate images for comparison with experimental micrographs, to determine experimental conditions under which experimental images were taken.
- Microscopy Primer
Introduction to Microscopy and Photography Through the Microscope. This treatise on Microscopy is divided into several sections: How to Set Up a Microscope, Photomicrography - Photography through the Microscope, Sample Preparation for Microscopy, and Creative Photomicrography. There's also a list pointing at microscopy resources on the web.
- NCSU Visualizations in Materials Science
An in-depth approach to material properties.
- SPM Imaging Modes
The scanning probe microscope (SPM) and more specifically the atomic force microscope (AFM) can be operated in many ways. These different techniques provide a variety of capabilities for imaging different types of samples and generating a wide range of information. Imaging modes (sometimes referred to as "scan modes" or "operating modes") are the methods that are used to move the AFM probe over the sample surface and sense the surface in order to create an image. There is a continuum of possible imaging modes, due to differing interactions between the probe tip and sample, as well as the detection scheme used. The choice of the appropriate mode depends on the specific application. This booklet is intended to help understand AFM imaging modes, to select the mode appropriate to the application, and to interpret the resulting images.
- Surface Analysis Techniques for Characterization of Materials
The home page of Charles Evans & Associates, "Specialists in Materials Characterization". This page contains ultra-condensed descriptions of a number of surface characterization techniques, including mass spectrometry techniques such as SIMS, TOF SIMS, MALDI, and GDMS, various scanning electron microscopy (SEM) techniques, including FE-SEM, EDS, AES, XPS, and ESCA, and a number of other techniques, such as RBS, HFS, SPM, AFM, STM, MFM, and TXRF. (Sigh!)
- Surface Analysis Tutorials
These tutorials are at present targeted at the college undergraduate to graduate level, but may appeal to anyone with some physical science background. Sections on theory and instrumentation for SIMS, RBS, and AES.
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Knut Irgum, Analytical Chemistry, Umeå University, S-901 87 Umeå, Sweden.
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